Combined Spectral Response/QE/IPCE and I-V Curve Measurement System
The two systems share a computer, computer peripherals and electronics equipment rack. Depending upon the configuration required for your devices, the two systems may share a test fixture. This reduces overall system cost.
In some configurations, test devices need to be mounted only once for both quantum efficiency and current-voltage measurements. The test fixture is then moved with the mounted device between the QE and I-V testing for characterization. However these measurements can not be made simultaneously on a device.